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FEI DualBeam™ Focused Ion Beam Scanning Electron MicroscopeThe Helios NanoLabAdelaide Microsccopy is very excited to announce their new addition. Installed in January 2008 this new microscope will be operated by the Dualbeam Engineer Len Green. For more details regarding the FIB's capabilities go to... http://www.feicompany.com/products/families/helios-nanolab-family.aspx
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