Atomic Force Microscope (AFM)
Information on the AFM NT-MDT Ntegra Solaris (AFM + SNOM)
The Atomic Force Microscope (AFM) is primarily used to measure and analyse surface topography and morphology, providing nanoscale height measurements.
The AFM is used for relatively small and flat samples - the maximum scan area is 100 x 100 microns and it can scan features up to 10 microns in height. Data collected provides information on the height of surface features, which allows both 2D and 3D imaging of a sample surface.
Examples of applications include the analysis of optical fibres, graphene, nanoparticles and nanotubes.
There is limited sample preparation involved and samples can be imaged in air. The two main modes used are contact and semi-contact modes.